Arbitrary Function Generators AFG31000 Series Datasheet Key features Patented InstaView technology enables engineers to see the actual waveform at the Device Under Test (DUT) in real time, without the need of an oscilloscope and probe, eliminating the uncertainty caused by mismatched impedance Sequencing option adds the ability to program long, complex waveforms with up to 256 steps The 9-inch capacitive touch screen works like a smart phone and has short-cuts to frequently used settings Built-in ArbBuilder lets you create and edit arbitrary waveforms on the instrument, eliminating the need to connect to a PC The Tektronix AFG31000 Series is a high-performance AFG with built-in arbitrary waveform generation, real-time waveform monitoring, and the Outputs are protected from over voltage and current to minimize largest touchscreen on the market. Providing advanced waveform potential instrument damage generation and programming capabilities, waveform verification, and a Compatible with TekBench software to help students set up, control, modern touch-screen interface, the new AFG31000 is sure to delight and and analyze test results in the lab simplify the job of every researcher and engineer. Applications Key performance specifications Advanced research 1 or 2 channel models Clock and system synchronization Output amplitude range 1 mV to 10 V into 50 loads P-P P-P Replication of real world signals Basic (AFG) mode: Component and circuit characterization and validation 25 MHz, 50 MHz, 100 MHz, 150 MHz, or 250 MHz sine waveforms 250 MSa/s, 1 GSa/s or 2 GSa/s sample rates Embedded circuit design and test 14-bit vertical resolution General purpose signal generation Built-in waveforms include sine, square, ramp, pulse, noise, and other frequently used waveforms Sweep, Burst, and Modulation modes (AM, FM, PM, FSK, and PWM) Advanced (Sequence) mode: Continuous mode (optional Sequence, Triggered and Gated modes) 16 Mpts arbitrary waveform memory on each channel (128 Mpts optional) Up to 256 steps in sequence mode with loop, jump and wait events Variable sampling clock 1 Sa/s to 2 GSa/s www.tektronix.com 1Datasheet Basic and Advanced Modes The AFG31000 series is the industrys first arbitrary function generator with full function Basic (AFG) and Advanced (Sequence) modes. In Basic mode, the AFG31000 generates traditional functions and arbitrary waveforms. The touchscreen and front-panel controls make it simple to set up. Basic mode lets you change frequency without the need to worry about waveform length and sample rate. This feature is useful in analog designs that characterize filter/amplifier frequency responses or in digital designs where clock rates change frequently. Advanced mode lets you build complex waveform sequences with flexible step controls Key settings are visible at a glance, and are easy to adjust using touch, numeric keypad, or rotary controls Sequenced sine waveforms with different frequency and amplitude. New with the AFG31000, Advanced mode provides the ability to generate Additionally, Advanced mode uses variable sample rate technology. Every multiple waveforms with complex timing. In this mode, you can compose a sample in a waveform is output once and only once in each cycle, list (or a sequence) of 1 to 256 waveforms, with total waveform length up to synchronized to the sample rate. Since there is no skipping or repetition, all 16 Mpts/ch (128 Mpts/ch optional) and define the ouput sequence of these details in the waveforms are kept. This feature is very useful for waveforms. Repeat, go-to, wait, jump, and triggered events are all applications in which signal fidelity is extremely critical, such as IQ supported and the large memory provides space to store many waveforms modulation and pulse train generation. or long waveforms. This feature is very useful in applications where many test cases need to InstaView technology shows the actual be performed sequentially. Instead of loading the test cases one by one, waveform at the DUT you can put all of them in a sequence and load at one time, switching from one to another seamlessly to greatly improve the test efficiency. Most waveform generators assume they are driving a 50 impedance. However, most devices under test do not have a 50 impedance. This mismatch results in an inconsistency between the waveform as set on the AFG and the signal at the DUT. 2 www.tektronix.com