INCH-POUND
MIL-M-38510/12J
22 February 2005
SUPERSEDING
MIL-M-38510/12H
16 December 2003
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, BIPOLAR, TTL, MONOSTABLE MULTIVIBRATORS, MONOLITHIC SILICON
This specification is approved for use by all Departments and Agencies of the Department of Defense.
Inactive for new design as of September 07, 1995.
The requirement for acquiring the product herein shall consist of this specification sheet and MIL-PRF-38535.
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic silicon, bipolar, TTL, monostable
multivibrators microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are
provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have
been superseded by MIL-PRF-38535, (see 6.3).
1.2 Part or Identifying number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as follows:
Device type Circuit
01 Single monostable multivibrator, with Schmitt trigger input
02 Single retriggerable monostable multivibrator with clear
03 Dual retriggerable monostable multivibrator with clear
04 One shot multivibrator
05 Dual one shot multivibrator
06 Single monostable multivibrator, with Schmitt trigger input 1/
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outline. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter Descriptive designator Terminals Package style
A 2/ GDFP5-F14 or CDFP6-F14 14 Flat pack
B 2/ GDFP4-14 14 Flat pack
C GDIP1-T14 or CDIP2-T14 14 Dual-in-line
D GDFP1-F14 or CDFP2-F14 14 Flat pack
E GDIP1-T16 or CDIP2-T16 16 Dual in line
F GDFP2-F16 or CDFP3-F16 16 Flat pack
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1/ For device type 06, the t maximum test limit under TABLE I and TABLE III is 168 ns at -55C, 125C.
P(OUT)1
2/ Inactive package case outline. Acceptable only for use in equipment designed or redesigned on or before
29 November 1986.
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43218-3990, or email
bipolar@dscc.dla.mil. Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at MIL-M-38510/12J
1.3 Absolute maximum ratings.
Supply voltage range ....................................................................... -0.5 V dc to +7.0 V dc
Input voltage range .......................................................................... -1.5 V dc at -12 mA to +5.5 V dc
Storage temperature range .............................................................. -65C to +150C
Maximum power dissipation (P ) per multivibrator:
D
Device types 01 and 06 ................................................................ 200 mW 3/
Device type 02 .............................................................................. 170 mW 3/
Device type 03 .............................................................................. 190 mW 3/
Device type 04 .............................................................................. 138 mW 3/
Device type 05 .............................................................................. 143 mW 3/
Lead temperature (soldering, 10 seconds) ...................................... +300C.
Junction temperature (T ) ................................................................ +175C 4/
J
Thermal resistance, junction-to-case ( ):
JC
Cases A, B, C, D, E, and F ........................................................... See MIL-STD-1835
1.4 Recommended operating conditions.
Supply voltage (V ) ....................................................................... 4.5 V dc minimum to 5.5 V dc maximum
CC
Minimum high-level input voltage (V ) ............................................ 2.4 V dc
IH
Maximum low-level input voltage (V ) ............................................. 0.4 V dc
IL
Normalized fanout (each output) :
Device types 01 and 06 ................................................................ 10 maximum 5/
Device types 02 and 03 (low level logic) ...................................... 10 maximum 5/
Device types 02 and 03 (high level logic) ..................................... 20 maximum 5/
Device type 04 (low level logic) .................................................... 6 maximum 5/
Device type 04 (high level logic) ................................................... 12 maximum 5/
Device type 05 (low level logic) .................................................... 8 maximum 5/
Device type 05 (high level logic) ................................................... 16 maximum 5/
Input pulse rise/fall time, device types 01 and 06:
Schmitt input (B) ........................................................................... 1 V/s maximum
Positive gains threshold voltage (V ) ......................................... 2.0 V maximum
T+
Negative gains threshold voltage (V ) ......................................... 0.8 V maximum
T-
Logic inputs (A1, A2) .................................................................... 1 V/s maximum
Input data setup time (t ):
SETUP
Device types 01 and 06 ................................................................ 60 ns minimum
Device types 02, 03, 04, and 05 ................................................... 40 ns minimum
Input data hold time (t ):
HOLD
Device types 01 and 06 ................................................................ 0 ns minimum
Device types 02, 03, 04, and 05 ................................................... 40 ns minimum
External timing resistance:
Device types 01 and 06 ................................................................ 30 k maximum
Device types 02, 03, 04 and 05 .................................................... 5 k minimum to 25 k maximum
Case operating temperature range (T ) .......................................... -55C to +125C
C
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3/ Must withstand the added P due to short circuit test (e.g., I ).
D OS
4/ Maximum junction temperature shall not be exceeded except for allowable short duration burn-in
screening conditions in accordance with MIL-PRF-38535.
5/ The device shall fanout in both high and low levels to the specified number of data inputs of the same
device type as that being tested.
2