HCPL-540x, 5962-89570, HCPL-543x, 1 HCPL-643x, 5962-89571 Hermetically Sealed, Very High Speed, Logic Gate Optocouplers Data Sheet Description Features These units are single and dual channel, hermetically sealed Dual marked with device part number and DLA Standard optocouplers. The products are capable of operation and Microcircuit Drawing (SMD) storage over the full military temperature range and can be Manufactured and tested on a MIL-PRF-38534 certified line purchased as either commercial product or with full QML-38534, Class H and K MIL-PRF-38534 Class Level H or K testing or from the Two hermetically sealed package configurations appropriate DLA Standard Microcircuit Drawing (SMD). All Performance guaranteed over full military temperature devices are manufactured and tested on a MIL-PRF-38534 range: 55 C to +125 C certified line, and Class H and K devices are included in the DLA High speed: 40 M bit/s Qualified Manufacturers List, QML-38534 for Hybrid Microcircuits. High common mode rejection 500 V/s guaranteed 1500 Vdc withstand test voltage CAUTION It is advised that normal static precautions be Active (totem pole) outputs taken in handling and assembly of this Three stage output available component to prevent damage and/or High radiation immunity degradation which may be induced by ESD. HCPL-2400/30 function compatibility Reliability data Compatible with TTL, STTL, LSTTL, and HCMOS logic families Applications Military and space High reliability systems Transportation, medical, and life critical systems Isolation of high-speed logic systems Computer-peripheral interfaces Switching power supplies Isolated bus driver (networking applications) (5400/1/K only) Pulse transformer replacement Ground loop elimination 1. See Selection Guide Lead Configuration Options for available Harsh industrial environments extensions. High-speed disk drive I/O Digital isolation for A/D, D/A conversion Broadcom - 1 -HCPL-540x, 5962-89570, HCPL-543x, HCPL-643x, 5962-89571 Functional Diagram Data Sheet Each channel contains an AlGaAs light emitting diode, which is Functional Diagram optically coupled to an integrated high gain photon detector. Multiple-channel devices available. This combination results in very high data rate capability. The detector has a threshold with hysteresis, which typically provides 0.25 mA of differential mode noise immunity and V CC minimizes the potential for output signal chatter. The detector V E in the single-channel units has a three-state output stage that eliminates the need for a pull-up resistor and allows for direct V drive of a data bus. O GND All units are compatible with TTL, STTL, LSTTL, and HCMOS logic families. The 35-ns pulse width distortion specification guarantees a 10 MBd signaling rate at +125C with 35% pulse width distortion. Figure 13 through Figure 16 show Truth Tables recommended circuits for reducing pulse width distortion and (Positive Logic) optimizing the signal rate of the product. Package styles for these parts are 8-pin DIP through hole (case outlines P) and leadless ceramic chip carrier (case outline 2). Devices can be Multichannel Devices purchased with a variety of lead bend and plating options. See Selection Guide Lead Configuration Options for details. Input Output Standard Microcircuit Drawing (SMD) parts are available for On (H) L each package and lead style. Off (L) H Because the same electrical die (emitters and detectors) are used for each channel of each device listed in this data sheet, absolute maximum ratings, recommended operating Single-Channel DIP conditions, electrical specifications, and performance characteristics shown in the figures are similar for all parts. Input Enable Output Occasional exceptions exist due to package variations and On (H) L L limitations and are as noted. Additionally, the same package assembly processes and materials are used in all devices. These Off (L) L H similarities give justification for the use of data obtained from On (H) H Z one part to represent other parts performance for die related Off (L) H Z reliability and certain limited radiation test results. NOTE The connection of a 0.1-F bypass capacitor between V and GND is recommended. CC Broadcom - 2 -