150.35.25.50 FIXTEST

150.35.25.50 electronic component of FIXTEST Images are for reference only, See Product Specifications

X-On Electronics has gained recognition as a prominent supplier of 150.35.25.50 Contact Probes across the USA, India, Europe, Australia, and various other global locations. 150.35.25.50 Contact Probes are a product manufactured by FIXTEST. We provide cost-effective solutions for Contact Probes, ensuring timely deliveries around the world.

Part No. 150.35.25.50
Manufacturer: FIXTEST
Category: Contact Probes
Description: Test needle; Operational spring compression: 3.4mm; 4A,5.5A
Datasheet:
Price (USD)
1: USD 3.3689 ea
Line Total: USD 3.37 
Availability : 0
  
QtyUnit Price
1$ 3.3689
5$ 2.993
7$ 2.8195
19$ 2.6605

Availability 0
Ship by Wed. 10 Sep to Fri. 12 Sep
MOQ : 1
Multiples : 1
QtyUnit Price
1$ 3.3689
5$ 2.993
7$ 2.8195
19$ 2.6605

   
Manufacturer
Product Category
Length
Current Rating
Type Of Test Accessories
Operational Spring Compression
Maksimum Spring Compression
Contact Plating
Max. Contact Resistance
Contact Material
Tip Diameter
Manufacturer Series
Operating Temperature
Spring Compression Force
LoadingGif
 
Notes:- Show Stocked Products With Similar Attributes.

We are delighted to provide the 150.35.25.50 from our Contact Probes category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the 150.35.25.50 and other electronic components in the Contact Probes category and beyond.

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