N3300 Series DC Electronic Loads Increase your manufacturing test throughput with fast electronic loads Increase test system throughput Lower cost of ownership Decrease system development time Increase system reliability Increase system flexibility Stable operation down to zero volts DC connection terminal for ATE applications Increase Test Throughput Todays high volume manufacturing requires optimization of test system throughput, to maximize production volume without increasing floorspace. The N3300 Series electronic loads can help you in a number of ways to achieve this goal. Find us at www.keysight.com Page 1 Reduced command processing time: Commands are processed more than 10 times faster than previous electronic loads. Automatically execute stored command sequences: Lists of downloaded command sequences can execute independent of the computer, greatly reducing the electronic load command processing time and computer interaction time during product testing. Programmable delay allows for either simultaneous or sequential load changes: This is the most multiple output DC power supplies, simulating real-life loading patterns, with a minimum of programming commands. Buffer measurement data: Voltage, current, and power measurements can be buffered for later readback to the computer, reducing computer interaction. Control measurement speed vs. accuracy: Decrease the number of measurement samples to achieve greater measurement speed, or increase the number of samples to achieve higher measurement accuracy. You can optimize your measurements for each test. Control rising and falling slew rates separately: Reduce rate of loading change when necessary for DUT stability or to simulate real life conditions, but otherwise change load values at maximum rate. Standard DC connectors Option UJ1 8 mm screw connectors Find us at www.keysight.com Page 2