Reference Only
Spec.No.JENF243A-9150-01 P1/8
Chip Ferrite Bead BLM03EBSH1D
Murata Standard Reference Specification [AEC-Q200]
1.Scope
This reference specification applies to Chip Ferrite Bead BLM03EB_SH series for Automotive Electronics based on
AEC-Q200 except for Power train and Safety.
2.Part Numbering
(ex.) BL M 03 EB 250 S H 1 D
(1) (2) (3) (4) (5) (6) (7) (8) (9)
(1)Product ID (4)Characteristics (7)Category(for Automotive Electronics)
(2)Type (5)Typical Impedance at 100MHz (8)Numbers of Circuit
(3)Dimension (L) (6)Performance (9)Packaging (D:Taping)
3.Rating
Impedance () DC Resistance
Rated
(Under Standard ( max.)
Customer MURATA Current (mA) ESD Rank
Testing Condition)
Initial Values
Part Number Part Number 2 :2kV
Values After
at 100MHz at 1GHz at 85 at 125
Testing
*1 *1
BLM03EB250SH1D 2525 10540 600 450 0.26 0.31
2
*1 *1
BLM03EB500SH1D 5025 25540 400 300 0.58 0.63
Operating Temperature : -55C to +125C Storage Temperature : -55C to +125C
Standard Testing Conditions
< Unless otherwise specified > < In case of doubt >
Temperature : Ordinary Temp. (15 C to 35 C ) Temperature : 20C2 C
Humidity : Ordinary Humidity (25%(RH) to 85%(RH)) Humidity : 60%(RH) to 70%(RH)
Atmospheric pressure : 86kPa to 106kPa
(Note) As for the Rated current marked with *1,
Rated Current is derated as right figure
depending on the operating temperature.
4.Style and Dimensions
0.60.03 0.30.03
Equivalent Circuit
Resistance element becomes
0.150.05
()
dominant at high frequencies.
: Electrode
Unit Weight (Typical value)
0.3m
(in mm)
5.Marking
No marking.
6.Specifications
6-1.Electrical Performance
No. Item Specification Test Method
6-1-1 Impedance Meet item 3. Measuring Frequency : 100MHz1MHz,1GHz1MHz
Measuring Equipment : KEYSIGHT4991A or the equivalent
Test Fixture : KEYSIGHT16192Aor16197A or the equivalent
Measuring Equipment : Digital multi meter
6-1-2 DC Resistance Meet item 3.
*Except resistance of the Substrate and Wire
MURATA MFG.CO.,LTD.
0.30.03Reference Only
Spec.No.JENF243A-9150-01 P2/8
6-2.Mechanical Performance (based on Table 13 for FILTER EMI SUPPRESSORS/FILTERS)
AEC-Q200 Rev.D issued June. 1 2010
AEC-Q200
Murata Specification / Deviation
No. Stress Test Method
3 High 1000hours at 125 deg C Meet Table A after testing.
Temperature Set for 24hours Table A
Exposure at room temperature,
Appearance No damage
then measured.
Impedance
Change Within 50%
(at 100MHz)
DC
Meet item 3.
Resistance
4 Temperature Cycling 1000cycles Meet Table A after testing.
-55 deg C to +125 deg C
Set for 24hours
at room temperature,
then measured.
5 Destructive Per EIA469 No defects
Physical Analysis No electrical tests
7 Biased Humidity 1000hours at 85 deg C, 85%RH Meet Table A after testing.
Apply max rated current.
8 Operational Life Apply Rated Current (at 125 deg C) Meet Table A after testing.
125 deg C 1000hours
Set for 24hours at
room temperature,
then measured
9 External Visual Visual inspection No abnormalities
10 Physical Dimension Meet ITEM 4 No defects
Style and Dimensions
12 Resistance Per MIL-STD-202 Method 215 Not Applicable
to Solvents
13 Mechanical Shock Per MIL-STD-202 Method 213 Meet Table B after testing.
Condition F: Table B
1500g's(14.7N)/0.5ms/Half sine
Appearance No damage
Impedance
Change Within 30%
(at 100MHz)
DC
Meet item 3.
Resistance
14 Vibration 5g's(0.049N) for 20 minutes,
12cycles each of 3 oritentations
Test from 10-2000Hz.
15 Resistance Solder temperature Pre-heating: 150C +/-10 deg C, 60s to 90s
to Soldering Heat 260C+/-5 deg C
Immersion time 10s Meet Table B after testing.
MURATA MFG.CO.,LTD.