Product Information

GCQ1555C1HR30CB01D

GCQ1555C1HR30CB01D electronic component of Murata

Datasheet
Multilayer Ceramic Capacitors MLCC - SMD/SMT 0402 50VDC 0.30pF 0.25pF AEC-Q200

Manufacturer: Murata
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

10000: USD 0.0374 ea
Line Total: USD 374

0 - Global Stock
MOQ: 10000  Multiples: 10000
Pack Size: 10000
Availability Price Quantity
0 - WHS 1


Ships to you between Wed. 22 May to Tue. 28 May

MOQ : 10000
Multiples : 10000
10000 : USD 0.1483
20000 : USD 0.1475
30000 : USD 0.1469
40000 : USD 0.146
50000 : USD 0.1452
60000 : USD 0.1445
100000 : USD 0.1436
150000 : USD 0.1429
200000 : USD 0.1419

0 - WHS 2


Ships to you between Wed. 22 May to Tue. 28 May

MOQ : 10000
Multiples : 10000
10000 : USD 0.0267
20000 : USD 0.0261
40000 : USD 0.0255

0 - WHS 3


Ships to you between Tue. 28 May to Thu. 30 May

MOQ : 1
Multiples : 1
1 : USD 0.2316
10 : USD 0.0942
100 : USD 0.0549
1000 : USD 0.0461
2500 : USD 0.04
10000 : USD 0.0364
20000 : USD 0.0326
50000 : USD 0.0314
100000 : USD 0.0291

     
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RoHS - XON
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Capacitance
Voltage Rating DC
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Dielectric
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Only Reflow Soldering High Q Chip Multilayer Ceramic Capacitors for Automotive GCQ1555C1HR30CB01 (0402, C0G:EIA, 0.3pF, DC50V) : packaging code Reference Sheet 1.Scope This product specification is applied to High Q Chip Multilayer Ceramic Capacitors used for Automotive Electronic equipment. This product is applied for Only Reflow Soldering. 2.MURATA Part NO. System (Ex.) GCQ 15 5 5C 1H R30 C B01 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 1.00.05 0.50.05 0.50.05 0.15 to 0.35 0.3 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):C0G(EIA) (5) Nominal Methods Rated Capacitance Temp. coeff Temp. Range Capacitance (Operating Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) 25 to 125 C 030 ppm/C DC 50 V 0.3 pF 0.25 pF -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 10000 pcs./Reel PAPER W8P2 f180mm Reel W 20000 pcs./Reel PAPER W8P1 f330mm Reel J 50000 pcs./Reel PAPER W8P2 Product specifications in this catalog are as of Jul.12,2017,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCQ1555C1HR30CB01-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specification. AEC-Q200 Test Method Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test board (glass epoxy board). Exposure (Storage) specifications in the following table. Set the capacitor for 1000+/-12h at 150+/-3. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within 2.5% or 0.25pF (Whichever is larger) Change Q Within the specified initial value. I.R. More than 10,000M or 500 F(Whichever is smaller) 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test board (glass epoxy board). specifications in the following table. Perform 1000 cycle test according to the four heat treatments listed Appearance No marking defects in the following table. Set for 24+/-2h at room temperature, then measure. Capacitance Within 2.5% or 0.25pF (Whichever is larger) Step Time(min) Temp.() Change Q Within the specified initial value. 1 153 -55+0/-3 2 1 Room 3 153 125+3/-0 I.R. More than 10,000M or 500 F(Whichever is smaller) 4 1 Room 25 4 Destructive No defects or abnormalities Per EIA-469. Physical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Solder the capacitor on the test board (glass epoxy board). specifications in the following table. Apply the 24h heat (25 to 65 ) and humidity (80 to 98%) treatment shown below, 10 consecutive times. Appearance No marking defects Set for 24+/-2h at room temperature, then measure. Capacitance Within 3.0% or 0.30pF (Whichever is larger) Humidity Humidity Change Temperature 8098% 80 98% Humidity Humidity Humidity () Q 30pFmin. : Q350 90 98% 9098% 9098% 70 10pF and over, 30pF and below : Q275+5C/2 65 60 10pFmax. : Q 200+10C 55 50 C: Nominal Capacitance(pF) 45 40 35 I.R. More than 10,000M or 500 F(Whichever is smaller) 30 25 25 20 +10 - 2 15 10 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours 6 The measured and observed characteristics should satisfy the Biased Humidity Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12h. Appearance No marking defects The charge/discharge current is less than 50mA. Remove and set for 24+/-2h at room temperature, then measure. Capacitance Within 3.0% or 0.30pF (Whichever is larger) Change Q 30pF and over : Q200 30pF and below : Q100+10C/3 C: Nominal Capacitance(pF) I.R. More than 1,000M or 50 F (Whichever is smaller) 25 JEMCGS-04995B 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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Murata Power Solutio
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Murata Power Solutions Inc
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