Product Information

CAT130019SWI-GT3

CAT130019SWI-GT3 electronic component of ON Semiconductor

Datasheet
Supervisory Circuits w/1k Microwire

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
N/A

Obsolete
Availability Price Quantity
0 - WHS 1

MOQ : 1
Multiples : 1

Stock Image

CAT130019SWI-GT3
ON Semiconductor

1 : USD 1.8711
10 : USD 1.3869
25 : USD 1.2726
100 : USD 1.0634
250 : USD 0.9941
500 : USD 0.859
1000 : USD 0.7051
3000 : USD 0.6675
6000 : USD 0.6518
N/A

Obsolete
     
Manufacturer
Product Category
RoHS - XON
Icon ROHS
Type
Mounting Style
Package / Case
Threshold Voltage
Number of Inputs Monitored
Manual Reset
Watchdog Timers
Supply Voltage - Max
Minimum Operating Temperature
Maximum Operating Temperature
Series
Packaging
Height
Length
Width
Brand
Overvoltage Threshold
Undervoltage Threshold
Operating Supply Current
Factory Pack Quantity :
Supply Voltage - Min
Cnhts
Hts Code
Mxhts
Product Type
Subcategory
Taric
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CAT130xx Voltage Supervisor with Microwire Serial CMOS EEPROM Description CAT130xx BLOCK DIAGRAM V CC DO ORG VOLTAGE EEPROM RST or RST CS DETECTOR SK DI V SS SPECIFICATIONS Table 1. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Storage Temperature 65 to +150 C Voltage on Any Pin with Respect to Ground (Note 1) 0.5 to +6.5 V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. The DC input voltage on any pin should not be lower than 0.5 V or higher than V + 0.5 V. During transitions, the voltage on any pin may CC undershoot to no less than 1.5 V or overshoot to no more than V + 1.5 V, for periods of less than 20 ns. CC Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units NEND (Note 3) Endurance 1,000,000 Program/ Erase Cycles TDR Data Retention 100 Years 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. 3. Block Mode, V = 5 V, 25C CC Table 3. D.C. OPERATING CHARACTERISTICS V = +2.5 V to +5.5 V, unless otherwise specified. CC Symbol Parameter Test Conditions Min Typ Max Units I Supply Current Read or Write at 1 MHz 3 mA CC I Standby Current V < 5.5 V All I/O Pins at V or V 12 25 A SB CC SS CC V < 3.6 V All I/O Pins at V or V 10 20 CC SS CC I I/O Pin Leakage Pin at GND or V 2 A L CC V Input Low Voltage 0.5 0.8 V IL V Input High Voltage 2.0 V + 0.5 V IH CC V Output Low Voltage V 2.5 V, I = 2.1 mA 0.4 V OL CC OL V Output High Voltage V 4.5 V, I = 0.4 mA 2.4 V OH CC OL

Tariff Desc

8542.31.00 51 No ..Application Specific (Digital) Integrated Circuits (ASIC)

Electronic integrated circuits: Processors and controllers, whether or not combined with memories, converters, logic circuits, amplifiers, clock and timing circuits, or other circuits
Monolithic integrated circuits:
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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