Product Information

CAT24C02WI-G

CAT24C02WI-G electronic component of ON Semiconductor

Datasheet
EEPROM (256x8) 2K 1.8-5.5

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

50: USD 0.4309 ea
Line Total: USD 21.54

0 - Global Stock
MOQ: 50  Multiples: 1
Pack Size: 1
Availability Price Quantity
0 - WHS 1


Ships to you between Thu. 23 May to Wed. 29 May

MOQ : 50
Multiples : 1

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CAT24C02WI-G
ON Semiconductor

50 : USD 0.4309
1500 : USD 0.4113

     
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RoHS - XON
Icon ROHS
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CAT24C01, CAT24C02, CAT24C04, CAT24C08, CAT24C16 1-Kb, 2-Kb, 4-Kb, 8-Kb and 2 16-Kb I C CMOS Serial CAT24C01, CAT24C02, CAT24C04, CAT24C08, CAT24C16 V CC Table 1. PIN FUNCTION Pin Name Function A0, A1, A2 Device Address Input SCL SDA Serial Data Input/Output SCL Serial Clock Input A , A , A CAT24Cxx SDA 2 1 0 WP Write Protect Input WP V Power Supply CC V Ground SS NC No Connect V SS The exposed pad for the TDFN/UDFN packages can be left floating or connected to Ground. Figure 1. Functional Symbol Table 2. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Storage Temperature 65 to +150 C Voltage on any pin with respect to Ground (Note 1) 0.5 to +6.5 V Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 1. During input transitions, voltage undershoot on any pin should not exceed 1 V for more than 20 ns. Voltage overshoot on pins A , A , A 0 1 2 2 and WP should not exceed V + 1 V for more than 20 ns, while voltage on the I C bus pins, SCL and SDA, should not exceed the absolute CC maximum ratings, irrespective of V . CC Table 3. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units N (Note 3) Endurance 1,000,000 Program / Erase Cycles END T Data Retention 100 Years DR 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. 3. Page Mode, V = 5 V, 25C. CC Table 4. D.C. OPERATING CHARACTERISTICS (V = 1.8 V to 5.5 V, T = 40C to +125C and V = 1.7 V to 5.5 V, T = 40C to +85C, unless otherwise specified.) CC A CC A Symbol Parameter Test Conditions Min Max Units I Read Current Read, f = 400 kHz 1 mA CCR SCL I Write Current Write, f = 400 kHz 2 mA CCW SCL I Standby Current All I/O Pins at GND or V T = 40C to +85C 1 A SB CC A V 3.3 V CC T = 40C to +85C 3 A V > 3.3 V CC T = 40C to +125C 5 A I I/O Pin Leakage Pin at GND or V 2 A L CC V Input Low Voltage 0.5 0.3 x V V IL CC V Input High Voltage A , A , A and WP 0.7 x V V + 0.5 V IH 0 1 2 CC CC SCL and SDA 0.7 x V 5.5 CC V Output Low V > 2.5 V, I = 3 mA 0.4 OL CC OL Voltage V < 2.5 V, I = 1 mA 0.2 CC OL Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions.

Tariff Desc

8542.32.00 32 No ..CMOS and MOS Read Only Memory and Programmable Read Only Memory whether erasable or non-erasable (for example, flash memory, EPROM, E2PROM, EAPROM, NOVRAM, ROM and PROM)
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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