LC75808W 1/8 to 1/10-Duty LCD Driver with Key Input Function Overview The LC75808W is 1/8 to 1/10 duty LCD display driver that can directly www.onsemi.com drive up to 600 segments and can control up to four general-purpose output ports. This product also incorporates a key scan circuit that accepts input from up to 30 keys to reduce printed circuit board wiring. Features Key input function for up to 30 keys (A key scan is performed only when a key is pressed.) 1/8duty1/4bias, 1/9duty1/4bias, and 1/10duty1/4bias drive schemes can be controlled from serial data. SPQFP100 14x14 / SQFP100 1/8duty1/4bias : up to 480 segments 1/9duty1/4bias : up to 540 segments 1/10duty1/4bias : up to 600 segments Sleep mode and all segments off functions that are controlled from serial data. Serial data I/O supports CCB* format communication with the system controller. Direct display of display data without the use of a decoder provides high generality. Built-in display contrast adjustment circuit. Up to 4 general-purpose output ports are included. Independent LCD driver block power supply V . LCD Provision of an on-chip voltage-detection type reset circuit prevents incorrect displays. The INH pin is provided. This pin turns off the display, disables key scanning, and forces the general-purpose output ports to the low level. RC oscillator circuit. * Computer Control Bus (CCB) is an ON Semiconductors original bus format and the bus addresses are controlled by ON Semiconductor. ORDERING INFORMATION See detailed ordering and shipping information on page 39 of this data sheet. Semiconductor Components Industries, LLC, 2017 1 Publication Order Number : July 2017 - Rev. 1 LC75808W/D LC75808W Specifications Absolute Maximum Ratings at Ta = 25 C, V = 0 V SS Parameter Symbol Conditions Ratings Unit Maximum supply voltage V max V 0.3 to +7.0 DD DD V V max V LCD LCD 0.3 to +12.0 Input voltage V 1 IN 0.3 to +7.0 CE, CL, DI, INH V 2 OSC, KI1 to KI5, TEST 0.3 to V +0.3 V IN DD V3 V 1, V 2, V 3, V 4 0.3 to V +0.3 IN LCD LCD LCD LCD LCD Output voltage V 1 DO 0.3 to +7.0 OUT V 2 OSC, KS1 to KS6, P1 to P4 0.3 to V +0.3 V OUT DD V 3 V 0, S1 to S60, COM1 to COM10 0.3 to V +0.3 OUT LCD LCD Output current I 1 S1 to S60 300 A OUT I 2 COM1 to COM10 3 OUT I 3 KS1 to KS6 1 mA OUT I 4 P1 to P4 5 OUT Allowable power dissipation Pd max Ta = 85C 200 mW Operating temperature Topr 40 to +85 C Storage temperature Tstg 55 to +125 C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. Allowable Operating Ranges at Ta = 40 to +85C, V = 0 V SS Ratings Parameter Symbol Conditions unit min typ max Supply voltage V V 4.5 6.0 DD DD V V , When the display contrast LCD LCD 7.0 11.0 V adjustment circuit is used V V , When the display contrast LCD LCD 4.5 11.0 adjustment circuit is not used Output voltage V 0 V0 V 4 LCD LCD LCD V V LCD +4.5 Input voltage V 1 V 1 3/4(V 0 LCD LCD LCD V 0 LCD V 4) LCD V 2 V 2 2/4(V 0 LCD LCD LCD V 0 LCD V 4) V LCD V 3 V 3 1/4(V 0 LCD LCD LCD V 0 LCD V 4) LCD V 4 V 4 0 1.5 LCD LCD Input high level voltage V 1 0.8V IH 6.0 V CE, CL, DI, INH DD V 2 KI1 to KI5 0.6V V V IH DD DD Input low level voltage V 0.2V IL 0 V CE, CL, DI, INH, KI1 to KI5 DD Recommended external R OSC OSC 43 k resistance Recommended external C OSC OSC 680 pF capacitance Guaranteed oscillation f OSC OSC 25 50 100 kHz range Data setup time tds CL, DI Figure 2 160 ns Data hold time tdh CL, DI Figure 2 160 ns CE wait time tcp CE, CL Figure 2 160 ns CE setup time tcs CE, CL Figure 2 160 ns CE hold time tch CE, CL Figure 2 160 ns High level clock pulse width CL Figure 2 t H 160 ns Low level clock pulse width CL Figure 2 t L 160 ns DO output delay time tdc DO R = 4.7 k , C = 10 pF *1 Figure 2 1.5 s PU L DO rise time tdr DO R = 4.7 k , C =10 pF *1 Figure 2 1.5 s PU L Note: *1. Since DO is an open-drain output, these values depend on the resistance of the pull-up resistor R and the PU load capacitance C . L Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. www.onsemi.com 2