Product Information

LE25S81MCTWG

LE25S81MCTWG electronic component of ON Semiconductor

Datasheet
NOR Flash 8M BIT SERIAL FLASH MEMORY, VCC=1.8V

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

2000: USD 0.8703 ea
Line Total: USD 1740.6

0 - Global Stock
MOQ: 2000  Multiples: 2000
Pack Size: 2000
Availability Price Quantity
0 - WHS 1


Ships to you between Thu. 23 May to Mon. 27 May

MOQ : 2000
Multiples : 2000

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LE25S81MCTWG
ON Semiconductor

2000 : USD 0.9018

0 - WHS 2


Ships to you between Fri. 17 May to Thu. 23 May

MOQ : 2000
Multiples : 2000

Stock Image

LE25S81MCTWG
ON Semiconductor

2000 : USD 1.0081

     
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Ordering number : EN*A2287 LE25S81MC Advance Information LE25S81MC Specifications Absolute Maximum Ratings Parameter Symbol Conditions Ratings unit Maximum supply voltage With respect to V 0.5 to +2.4 V SS DC voltage (all pins) With respect to V 0.5 to V +0.5 V SS DD Storage temperature Tstg 55 to +150 C Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. Operating Conditions Parameter Symbol Conditions Ratings unit Operating supply voltage 1.65 to 1.95 V Operating ambient temperature Write operation 40 to +90 C Read operation 40 to +90 Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability. Allowable DC Operating Conditions Ratings Parameter Symbol Conditions unit min typ max SCK = 0.1V /0.9V , 33MHz 6mA DD DD Single HOLD = WP = 0.9V , DD 40MHz 8mA Read mode operating current I CCR SO = open Dual *1 40MHz 10 mA Write mode operating current I t = t = t = typ., t = max CCW SSE SE CHE PP 40mA (erase+page program) CMOS standby current I CS = V , HOLD = WP = V , SB DD DD 50 A SI = V /V , SO = open SS DD CS HOLD WP Power-down standby current I = V , = = V , DSB DD DD 15 A SI = V /V , SO = open SS DD Input leakage current I 2 A LI Output leakage current I 2 A LO Input low voltage V 0.3 0.3V V IL DD Input high voltage V 0.7V V +0.3 V IH DD DD Output low voltage V I = 100A, V = V min 0.2 OL OL DD DD V I = 1.6mA, V = V min 0.4 OL DD DD Output high voltage V I = 100A, V = V min V 0.2 V OH OH DD DD CC *1: Dual Read is not supported on LE25S81MC. Data hold, Rewriting frequency Parameter Conditions min max unit Program/Erase 100,000 times/ Rewriting frequency Sector Status resister write 1,000 Data hold 20 year Pin Capacitance at Ta = 25C, f = 1MHz Ratings Parameter Symbol Conditions unit max Output pin capacitance C V = 0V 12 pF SO SO Input pin capacitance C V = 0V 6 pF IN IN Note: These parameter values do not represent the results of measurements undertaken for all devices but rather values for some of the sampled devices. No.A2287-2/23

Tariff Desc

8542.32.00 32 No ..CMOS and MOS Read Only Memory and Programmable Read Only Memory whether erasable or non-erasable (for example, flash memory, EPROM, E2PROM, EAPROM, NOVRAM, ROM and PROM)
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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