MC74VHC373 Octal D-Type Latch with 3-State Output The MC74VHC373 is an advanced high speed CMOS octal latch with 3state output fabricated with silicon gate CMOS technology. It achieves high speed operation similar to equivalent Bipolar Schottky MC74VHC373 3 2 D0 Q0 4 5 D1 Q1 7 6 FUNCTION TABLE D2 Q2 8 9 DATA D3 Q3 INPUTS OUTPUT NONINVERTING INPUTS 13 12 OUTPUTS D4 Q4 OE LE D Q 14 15 L H H H D5 Q5 L H L L 17 16 D6 Q6 L L X No Change 18 19 H X X Z D7 Q7 11 LE 1 OE Figure 1. Logic Diagram MAXIMUM RATINGS Symbol Parameter Value Unit This device contains protection circuitry to guard against damage V DC Supply Voltage 0.5 to + 7.0 V CC due to high static voltages or electric V DC Input Voltage 0.5 to + 7.0 V fields. However, precautions must in be taken to avoid applications of any V DC Output Voltage 0.5 to V + 0.5 V out CC voltage higher than maximum rated I Input Diode Current 20 mA voltages to this highimpedance cir- IK cuit. For proper operation, V and in I Output Diode Current 20 mA OK V should be constrained to the out range GND (V or V ) V . I DC Output Current, per Pin 25 mA in out CC out Unused inputs must always be I DC Supply Current, V and GND Pins 75 mA CC CC tied to an appropriate logic voltage level (e.g., either GND or V ). P Power Dissipation in Still Air, SOIC Package 500 mW CC D Unused outputs must be left open. T Storage Temperature 65 to + 150 C stg Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. Derating SOIC Package: 7 mW/ C from 65 to 125 C RECOMMENDED OPERATING CONDITIONS Symbol Parameter Min Max Unit V DC Supply Voltage 2.0 5.5 V CC V DC Input Voltage 0 5.5 V in V DC Output Voltage 0 V V out CC T Operating Temperature 40 + 85 C A t , t Input Rise and Fall Time V = 3.3 V 0 100 ns/V r f CC V = 5.0 V 0 20 CC Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended Operating Ranges limits may affect device reliability.