Product Information

NUP8011MUTAG

NUP8011MUTAG electronic component of ON Semiconductor

Datasheet
ON Semiconductor TVS Diode Arrays LOW CAP OCTAL TVS ARRAY

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1: USD 0.5669 ea
Line Total: USD 0.57

2690 - Global Stock
Ships to you between
Mon. 27 May to Wed. 29 May
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
2686 - WHS 1


Ships to you between Mon. 27 May to Wed. 29 May

MOQ : 1
Multiples : 1

Stock Image

NUP8011MUTAG
ON Semiconductor

1 : USD 0.5669
10 : USD 0.5095
100 : USD 0.4324
250 : USD 0.4278
500 : USD 0.4048
1000 : USD 0.4036
3000 : USD 0.4036
9000 : USD 0.3876

1699 - WHS 2


Ships to you between Tue. 21 May to Mon. 27 May

MOQ : 18
Multiples : 1

Stock Image

NUP8011MUTAG
ON Semiconductor

18 : USD 0.4639
25 : USD 0.4557
100 : USD 0.4497
250 : USD 0.4407

     
Manufacturer
Product Category
RoHS - XON
Icon ROHS
Series
Product Type
Vesd - Voltage ESD Contact
Polarity
Number of Channels
Termination Style
Breakdown Voltage
Working Voltage
Cd - Diode Capacitance
Package / Case
Minimum Operating Temperature
Maximum Operating Temperature
Packaging
Operating Voltage
Capacitance
Dimensions
Brand
Channels
Mounting Style
Factory Pack Quantity :
Cnhts
Hts Code
Mxhts
Pd - Power Dissipation
Subcategory
Taric
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NUP8011MU ESD Protection Diode Array Low Clamping Voltage This integrated surge protection device is designed for applications requiring transient overvoltage protection. It is intended for use in sensitive equipment such as computers, printers, business machines, communication systems, and other applications. Its integrated design provides very effective and reliable protection for eight separate lines www.onsemi.com using only one package. These devices are ideal for situations where board space is at a premium. 1 8 Features Low Clamping Voltage UDFN Package, 1.2 x 1.8 mm 2 7 Standoff Voltage: 4.3 V Low Leakage Current IEC6100042, Level 4 ESD Protection 3 6 Moisture Sensitivity Level 1 These Devices are PbFree, Halogen Free/BFR Free and are RoHS Compliant 4 5 Benefits Provides Protection for ESD Industry Standards: IEC 61000, HBM Protects the Line Against Transient Voltage Conditions (Top View) Minimize Power Consumption of the System Minimize PCB Board Space MARKING Applications 8 DIAGRAM ESD Protection for Data Lines 1 P3 M Wireless Phones UDFN8 1 Handheld Products CASE 517AD Notebook Computers P3 = Specific Device Code LCD Displays M = Month Code = PbFree Package MAXIMUM RATINGS (T = 25C unless otherwise noted) A Characteristic Symbol Value Unit Steady State Power 1 Diode (Note 1) P 380 mW D PIN CONNECTIONS Thermal Resistance, R 327 C/W JA JunctiontoAmbient 3.05 mW/C 14 Above 25C, Derate Maximum Junction Temperature T 150 C Jmax Operating Temperature Range T 40 to +85 C OP Storage Temperature Range T 55 to +150 C stg Lead Solder Temperature (10 seconds T 260 C L duration) 8 5 IEC 6100042 (ESD)Contact 8.0 kV Machine Model Class C MM 400 V ORDERING INFORMATION Human Body Model Class 3B HBM 8.0 kV Stresses exceeding those listed in the Maximum Ratings table may damage the Device Package Shipping device. If any of these limits are exceeded, device functionality should not be NUP8011MUTAG UDFN8 3000 / Tape & Reel assumed, damage may occur and reliability may be affected. 1. Only 1 diode under power. For all 4 diodes under power, P will be 25%. (PbFree) D Mounted on FR 4 board with min pad. For information on tape and reel specifications, See Application Note AND8308/D for further description of including part orientation and tape sizes, please survivability specs. refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. Semiconductor Components Industries, LLC, 2017 1 Publication Order Number: November, 2017 Rev. 4 NUP8011MU/DNUP8011MU ELECTRICAL CHARACTERISTICS I (T = 25C unless otherwise noted) A I F Symbol Parameter I Maximum Reverse Peak Pulse Current PP V Clamping Voltage I C PP V V V V Working Peak Reverse Voltage C BR RWM RWM V I V R F I Maximum Reverse Leakage Current V I R RWM T V Breakdown Voltage I BR T I Test Current T I Forward Current F I PP V Forward Voltage I F F UniDirectional P Peak Power Dissipation pk C Capacitance V = 0 and f = 1.0 MHz R *See Application Note AND8308/D for detailed explanations of datasheet parameters. ELECTRICAL CHARACTERISTICS (T = 25C) A Typ Capacitance Typ Capacitance Breakdown Voltage Leakage Current 0 V Bias (pF) 3 V Bias (pF) V 1 mA (V) I V (Note 2) (Note 2) V BR RM RM C Device I Per IEC6100042 RWM (Note 3) Marking Min Nom Max V ( A) Typ Max Typ Max Device RWM NUP8011MUTAG P3 6.47 6.8 7.14 4.3 1.0 12 14 6.7 9.5 Figures 1 and 2 (See Below) Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 2. Capacitance of one diode at f = 1 MHz, V = 0 V, T = 25C R A 3. For test procedure see Figures 3 and 4 and Application Note AND8307/D. Figure 1. ESD Clamping Voltage Screenshot Figure 2. ESD Clamping Voltage Screenshot Positive 8 kV Contact per IEC6100042 Negative 8 kV Contact per IEC6100042 www.onsemi.com 2

Tariff Desc

8541.10.00 15 No - Diodes, other than photosensitive or light emitting diodes Free

DIODES, TRANSISTORS AND SIMILAR SEMICONDUCTOR DEVICES; PHOTOSENSITIVE SEMICONDUCTOR DEVICES, INCLUDING PHOTOVOLTAIC CELLS WHETHER OR NOT ASSEMBLED IN MODULES OR MADE UP INTO PANELS
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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