TE Connectivity Contact Probes
Contact probes are specialized electrical test probes that are placed against the component surface and measure electrical characteristics such as voltage and current. They are usually attached to the tip of a handheld testing device known as a probe station. They are used to check electrical connections and perform voltage, current, and power measurements. They can also be used to detect short circuits, open circuits, and other electronics faults.
Contact probes are especially useful in engineering and design, as they allow engineers to obtain quick readings of voltage, current, and other electrical parameters without having to open components or expose them to the risk of extremely high voltages. Additionally, they can now be used to read digital data stored on modern chips, allowing for more efficient testing of integrated circuits.