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ADIS16505-3BMLZ

ADIS16505-3BMLZ electronic component of Analog Devices

Datasheet
IMUs - Inertial Measurement Units 6 DOF Prec IMU 8g 2000 DPS DNR

Manufacturer: Analog Devices
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ADIS16505-3BMLZ
Analog Devices

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Precision, Miniature MEMS IMU Data Sheet ADIS16505 FEATURES GENERAL DESCRIPTION Triaxial, digital gyroscope The ADIS16505 is a precision, miniature microelectromechanical 125/sec, 500/sec, 2000/sec dynamic range models system (MEMS) inertial measurement unit (IMU) that includes 2.3/hr in-run bias stability (ADIS16505-1) a triaxial gyroscope and a triaxial accelerometer. Each inertial 0.13/hr angular random walk, x-axis and y-axis, 1 sensor in the ADIS16505 combines with signal conditioning (ADIS16505-1) that optimizes dynamic performance. The factory calibration 0.25 axis to axis misalignment error characterizes each sensor for sensitivity, bias, alignment, Triaxial, digital accelerometer, 78.4 m/sec dynamic range linear acceleration (gyroscope bias), and point of percussion 26.5 m/sec in-run bias stability (x-axis and y-axis) (accelerometer location). As a result, each sensor has dynamic Triaxial, delta angle and delta velocity outputs compensation formulas that provide accurate sensor Factory calibrated sensitivity, bias, and axial alignment measurements over a broad set of conditions. Calibration temperature range: 40C to +85C The ADIS16505 provides a simplified, cost effective method for SPI compatible data communications integrating accurate, multiaxis inertial sensing into industrial Programmable operation and control systems, especially when compared with the complexity and Automatic and manual bias correction controls investment associated with discrete designs. All necessary motion Data ready indicator for synchronous data acquisition testing and calibration are part of the production process at the External sync modes: direct, scaled, and output factory, greatly reducing system integration time. Tight orthogonal On demand self-test of inertial sensors alignment simplifies inertial frame alignment in navigation On demand self-test of flash memory systems. The serial peripheral interface (SPI) and register Single-supply operation (VDD): 3.0 V to 3.6 V structure provide a simple interface for data collection and 2 14,700 m/sec mechanical shock survivability configuration control. Operating temperature range: 40C to +105C The ADIS16505 is available in a 100-ball, ball grid array (BGA) APPLICATIONS package that is approximately 15 mm 15 mm 5 mm. Navigation, stabilization, and instrumentation Unmanned and autonomous vehicles Smart agriculture and construction machinery Factory/industrial automation, robotics Virtual/augmented reality Internet of Moving Things FUNCTIONAL BLOCK DIAGRAM DR RST VDD POWER GND SELF TEST INPUT/OUTPUT MANAGEMENT OUTPUT CS TRIAXIAL DATA GYROSCOPE REGISTERS SCLK CALIBRATION TRIAXIAL SPI CONTROLLER AND ACCELEROMETER DIN FILTERS USER CONTROL TEMPERATURE DOUT REGISTERS SENSOR CLOCK ADIS16505 SYNC Figure 1. Rev. C Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. rights of third parties that may result from its use. Specifications subject to change without notice. Tel: 781.329.4700 20192020 Analog Devices, Inc. All rights reserved. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. Technical Support www.analog.com 17328-001ADIS16505 Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 SPI ................................................................................................ 17 Applications ...................................................................................... 1 Data Ready (DR) ........................................................................ 17 General Description ......................................................................... 1 Reading Sensor Data .................................................................. 18 Functional Block Diagram .............................................................. 1 Burst Read Function .................................................................. 19 Revision History ............................................................................... 2 Latency ......................................................................................... 21 Specifications .................................................................................... 3 Device Configuration ................................................................ 21 Timing Specifications .................................................................. 6 Memory Structure ...................................................................... 21 Absolute Maximum Ratings ....................................................... 7 User Register Memory Map .......................................................... 22 Thermal Resistance ...................................................................... 7 User Register Defintions ............................................................... 24 ESD Caution.................................................................................. 7 Gyroscope Data .......................................................................... 24 Pin Configuration and Function Descriptions ............................ 8 Delta Angles ................................................................................ 28 Typical Performance Characteristics ........................................... 11 Delta Velocity ............................................................................. 29 Gyroscopes .................................................................................. 11 Calibration .................................................................................. 31 Accelerometers ........................................................................... 14 Applications Information ............................................................. 38 Theory of Operation ...................................................................... 15 Assembly and Handling Tips ................................................... 38 Introduction ................................................................................ 15 Power Supply Considerations .................................................. 39 Clock Control ............................................................................. 15 Evaluation Tools ......................................................................... 39 Bartlett Window Filter ............................................................... 16 Packaging and Ordering Information ......................................... 41 Calibration ................................................................................... 16 Outline Dimensions ................................................................... 41 Decimation Filter ....................................................................... 16 Ordering Guide .......................................................................... 41 Register Structure ....................................................................... 16 REVISION HISTORY 10/2020Rev. B to Rev. C Changes to Figure 44 and Figure 45 ............................................ 20 Change to Linear Acceleration Effect Parameter, Table 1 .......... 3 Changes to Table 9 ......................................................................... 23 Changes to Figure 29 ..................................................................... 15 Changes to Table 11 ....................................................................... 24 Changes to SPI Section and Figure 34 ......................................... 17 Changes to Table 102 and Table 106 ........................................... 33 Changes to Burst Read Function .................................................. 19 Changes to Table 108 and Table 110 ........................................... 34 Changes to Table 27 ....................................................................... 26 Deleted Table 111 and Table 112 Renumbered Sequentially ........ 34 Changes to Figure 64 and Figure 65 ............................................ 40 Deleted Bias Correction Update Section ......................................... 35 Changes to Ordering Guide .......................................................... 41 Changes to Table 113, Table 115, Table 117, Table 119, and Table 121 ................................................................................................... 36 7/2020Rev. A to Rev. B Changes to Table 129 and Table 131 ........................................... 37 Changes to Table 1 ........................................................................... 3 Changes to Figure 65 ..................................................................... 40 Changes to Table 3 and Table 4...................................................... 7 Changes to Clock Control Section ............................................... 15 10/2019Revision A: Initial Version Rev. C Page 2 of 41

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9027.10.00 Instruments and apparatus for physical or chemical analysis (for example, polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus); instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light (including exposure meters); microtomes.

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