BLM15GA750SZ1D Murata

Reference Spec.No.JENF243A-9120B-01 P1/8 Reference Only High-GHz Noise Suppression Chip Ferrite Bead BLM15GSZ1D Murata Standard Reference Specification AEC-Q200 1.Scope This reference specification applies to Chip Ferrite Bead BLM15G SZ series based on AEC-Q200 except for Power train and Safety. 2.Part Numbering (ex.) BL M 15 GA 750 S Z 1 D (1) (2) (3) (4) (5) (6) (7) (8) (9) (1)Product ID (4)Characteristics (7)Category(for Automotive Electronics) (2)Type (5)Typical Impedance at 100MHz (8)Numbers of Circuit (3)Dimension (L) (6)Performance (9)Packaging (D:Taping) 3.Rating DC Resistance Impedance () ( max.) (*1) (refer to below (at 100MHz)(*1) Rated ESD Rank Customer MURATA comment) (refer to below comment) Current 2 :2kV Part Number Part Number (mA) Initial Values Values After at100MHz at1GHz Testing 7525% 100040% BLM15GA750SZ1D 200 1.3 1.4 BLM15GG221SZ1D 22025% 60040% 300 0.7 0.8 2 47025% 120040% BLM15GG471SZ1D 200 1.3 1.4 Operating Temperature : -55C to +125C Storage Temperature : -55C to +125C (*1) Standard Testing Conditions Unless otherwise specified In case of doubt Temperature : Ordinary Temp. (15 C to 35 C ) Temperature : 20C2 C Humidity : Ordinary Humidity (25%(RH) to 85%(RH)) Humidity : 60%(RH) to 70%(RH) Atmospheric pressure : 86kPa to 106kPa 4.Style and Dimensions 1.00.05 0.50.05 Equivalent Circuit 0.250.1 Resistance element becomes () dominant at high frequencies. : Electrode Unit Mass (Typical value) (in mm) 0.001g 5.Marking No marking. MURATA MFG.CO.,LTD. 0.50.05Reference Spec.No.JENF243A-9120B-01 P2/8 Reference Only 6.Specifications 6-1.Electrical Performance No. Item Specification Test Method 6-1-1 Impedance Meet item 3. Measuring Frequency : 100MHz1MHz,1GHz1MHz Measuring Equipment : KEYSIGHT4291A or the equivalent Test Fixture : Agilent16192A or the equivalent 6-1-2 DC Resistance Meet item 3. Measuring Equipment : Digital multi meter *Except resistance of the Substrate and Wire 6-2.Mechanical Performance (based on Table 13 for FILTER EMI SUPPRESSORS/FILTERS) AEC-Q200 Rev.D issued June. 1 2010 AEC-Q200 Murata Specification / Deviation No. Stress Test Method 3 High 1000hours at 125 deg C Meet Table A after testing. Temperature Set for 24hours Table A Exposure at room temperature, Appearance No damage then measured. Impedance Change Within 30% (at 100MHz) DC Meet item 3. Resistance 4 Temperature Cycling 1000cycles Meet Table A after testing. -55 deg C to +125 deg C Set for 24hours at room temperature, then measured. 5 Destructive Per EIA469 No defects Physical Analysis No electrical tests 7 Biased Humidity 1000hours at 85 deg C, 85%RH Meet Table A after testing. Apply max rated current. Meet Table A after testing. 8 Operational Life Apply 125 deg C 1000hours If the rated current of parts exceed 1A, Set for 24hours at the operating temperature should be 85 deg C. room temperature, then measured 9 External Visual Visual inspection No abnormalities 10 Physical Dimension Meet ITEM 4 No defects Style and Dimensions 12 Resistance Per MIL-STD-202 Method 215 Not Applicable to Solvents 13 Mechanical Shock Per MIL-STD-202 Method 213 Meet Table A after testing. Condition F: 1500g s(14.7N)/0.5ms/Half sine 14 Vibration 5g s(0.049N) for 20 minutes Meet Table A after testing. 12cycles each of 3 oritentations Test from 10-2000Hz. MURATA MFG.CO.,LTD.