Product Information

GCM31CR71A106KA64K

GCM31CR71A106KA64K electronic component of Murata

Datasheet
Murata Electronics Multilayer Ceramic Capacitors MLCC - SMDSMT 10uF 10Volts X7R 10%

Manufacturer: Murata
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

60000: USD 0.0835 ea
Line Total: USD 5010

0 - Global Stock
MOQ: 60000  Multiples: 60000
Pack Size: 60000
Availability Price Quantity
0 - WHS 1


Ships to you between Tue. 14 May to Thu. 16 May

MOQ : 60000
Multiples : 60000
60000 : USD 0.4048

     
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CHIP MONOLITHIC CERAMIC CAPACITOR FOR AUTOMOTIVE GCM31CR71A106KA64 (1206, X7R, 10uF, 10Vdc) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Monolithic Ceramic Capacitor used for Automotive Electronic equipment. 2.MURATA Part NO. System (Ex.) GCM 31 C R7 1A 106 K A64 L (1)L/W (2)T (3)Temperature (4)DC Rated (5)Nominal (6)Capacitance (7)Muratas (8)Packaging Dimensions Characteristics Voltage Capacitance Tolerance Control Code Code Dimensions 3. Type & Dimensions L W T e g e (Unit:mm) (1)-1 L (1)-2 W (2) T e g 3.20.2 1.60.2 1.60.2 0.3 to 0.8 1.5 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X7R(EIA) (5) Nominal Methods DC Rated Capacitance (Operationg Temp. coeff Temp. Range Capacitance Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 125 C 10 Vdc 10 uF 10 % -15 to 15 % -55 to 125 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel L 2000 pcs./Reel EMBOSSED W8P4 f330mm Reel K 6000 pcs./Reel EMBOSSED W8P4 Product specifications in this catalog are as of Jan.26,2013,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GCM31CR71A106KA64-01 1AEC-Q200 Murata Standard Specification and Test Methods Specification. No AEC-Q200 Test Item AEC-Q200 Test Method Temperature High Dielectric Type Compensating Type Pre-and Post-Stress 1 - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Set the capacitor for 100012 hours at 1503. Set for Exposure (Storage) specifications in the following table. 242 hours at room temperature, then measure. Appearance No marking defects Capacitance Within 2.5% or 0.25pF R7/C7/L8/R9: Within 10.0% Change (Whichever is larger) Q/D.F. 30pFmin. : Q1000 R7/C7/L8 : W.V.: 25Vmin.: 0.03 max. 30pFmax.: Q 400+20C W.V.: 16/10V : 0.05 max. C: Nominal Capacitance(pF) R9 : 0.075max. I.R. More than 10,000M or 500 F (Whichever is smaller) R9 : More than 150 F 3 Temperature Cycling The measured and observed characteristics should satisfy the Fix the capacitor to the supporting jig in the same manner and under specifications in the following table. the same conditions as (19). Perform the 1000 cycles or 300 cycles Appearance No marking defects according to the four heat treatments listed in the following table. Capacitance Within 2.5% or 0.25pF R7/C7/L8/R9: Within 10.0% Set for 242 hours at room temperature, then measure Change (Whichever is larger) Cycles Q/D.F. 30pFmin. : Q1000 R7/C7/L8 W.V.: 25Vmin.: 0.03 max. Step Time(min) 1000(for C/R7/C7) 300(for 5G/L8/R9) 30pFmax.: Q 400+20C W.V.: 16/10V : 0.05 max. 1 153 -55+0/-3 -55+0/-3 C: Nominal Capacitance(pF) R9 : 0.05max. 2 1 Room Room 3 153 125+3/-0 150+3/-0 I.R. More than 10,000M or 500 F 4 1 Room Room (Whichever is smaller) Initial measurement for high dielectric constant type Perform a heat treatment at 150+0/-10 for one hour and then set for 242 hours at room temperature. Perform the initial measurement. 4 Destructive No defects or abnormalities Per EIA-469. Phisical Analysis 5 Moisture Resistance The measured and observed characteristics should satisfy the Apply the 24-hour heat (25 to 65) and humidity (80 to 98%) specifications in the following table. treatment shown below, 10 consecutive times. Appearance No marking defects Set for 242 hours at room temperature, then measure. Humidity Humidity Capacitance Within 3.0% or 0.30pF R7/C7/L8/R9: Within 12.5% Temperature 8098% 8098% Humidity Humidity Humidity () Change (Whichever is larger) 9098% 9098% 9098% 70 Q/D.F. R7/C7/L8 : W.V.: 25Vmin.: 0.03 max. 30pFmin. : Q350 65 60 10pF and over, 30pF and below: W.V.: 16/10V : 0.05 max. 55 Q275+5C/2 R9 : 0.075max 50 45 10pFmax.: Q 200+10C 40 35 C: Nominal Capacitance(pF) 30 I.R. More than 10,000M or 500 F 25 +10 20 (Whichever is smaller) - 2 15 10 R9 : More than 150 F 5 Initial measuremt 0 -5 -10 One cycle 24hours 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 Hours 6 Biased Humidity The measured and observed characteristics should satisfy the Apply the rated voltage and 1.3+0.2/-0vdc (add 6.8k resister) specifications in the following table. at 853 and 80 to 85% humidity for 100012 hours. Appearance No marking defects Remove and set for 242 hours at room temprature, then measure. Capacitance Within 3.0% or 0.30pF R7/C7/L8/R9: Within 12.5% The charge/discharge current is less than 50mA. Change (Whichever is larger) Q/D.F. 30pF and over: Q200 R7/C7/L8 : W.V.: 25Vmin.: 0.035 max. 30pF and below: Q100+10C/3 W.V.: 16/10V : 0.05 max. C: Nominal Capacitance(pF) R9 : 0.075max. I.R. More than 1,000M or 50 F (Whichever is smaller) JEMCGS-0382F 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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