X-On Electronics has gained recognition as a prominent supplier of GRT033R61E331KE01D Multilayer Ceramic Capacitors MLCC - SMD/SMT across the USA, India, Europe, Australia, and various other global locations. GRT033R61E331KE01D Multilayer Ceramic Capacitors MLCC - SMD/SMT are a product manufactured by Murata. We provide cost-effective solutions for Multilayer Ceramic Capacitors MLCC - SMD/SMT, ensuring timely deliveries around the world.

GRT033R61E331KE01D Murata

GRT033R61E331KE01D electronic component of Murata
GRT033R61E331KE01D Murata
GRT033R61E331KE01D Multilayer Ceramic Capacitors MLCC - SMD/SMT
GRT033R61E331KE01D  Passive Components

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Part No. GRT033R61E331KE01D
Manufacturer: Murata
Category: Multilayer Ceramic Capacitors MLCC - SMD/SMT
Description: Multilayer Ceramic Capacitors MLCC - SMDSMT
Datasheet: GRT033R61E331KE01D Datasheet (PDF)
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)
1: USD 0.1063 ea
Line Total: USD 0.11 
Availability - 39736
Ship by Tue. 01 Jul to Thu. 03 Jul
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
39736
Ship by Tue. 01 Jul to Thu. 03 Jul
MOQ : 1
Multiples : 1
1 : USD 0.1063
10 : USD 0.01
100 : USD 0.0062
500 : USD 0.005
1000 : USD 0.0038
10000 : USD 0.0035
15000 : USD 0.0023

   
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We are delighted to provide the GRT033R61E331KE01D from our Multilayer Ceramic Capacitors MLCC - SMD/SMT category, at competitive rates not only in the United States, Australia, and India, but also across Europe and beyond. A long established and extensive electronic component distribution network has enhanced our global reach and dependability, ensuring cost savings through prompt deliveries worldwide. Client satisfaction is at the heart of our business, where every component counts and every customer matters. Our technical service team is ready to assist you. From product selection to after-sales support, we strive to deliver a seamless and satisfying experience. Are you ready to experience the best in electronic component distribution? Contact X-ON Electronics today and discover why X-On are a preferred choice for the GRT033R61E331KE01D and other electronic components in the Multilayer Ceramic Capacitors MLCC - SMD/SMT category and beyond.

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AEC-Q200 Compliant Chip Multilayer Ceramic Capacitors for Infotainment GRT033R61E331KE01 (0201, X5R:EIA, 330pF, DC25V) : packaging code Reference Sheet 1.Scope This product specification is applied to Chip Multilayer Ceramic Capacitors used for Car Multimedia, Car Interior, Car Comfort application and General Electronic equipment. Please contact us when using this product for any other applications than described in the above. Do not use these products in applications critical to passenger safety and car driving function (e.g. ABS, AIRBAG, etc.). 2.MURATA Part NO. System (Ex.) GRT 03 3 R6 1E 331 K E01 D (1)L/W (2)T (3)Temperature (4)Rated (5)Nominal (6)Capacitance (7)Muratas Control (8)Packaging Code Dimensions Dimensions Characteristics Voltage Capacitance Tolerance Code 3. Type & Dimensions (Unit:mm) (1)-1 L (1)-2 W (2) T e g 0.60.03 0.30.03 0.30.03 0.1 to 0.2 0.2 min. 4.Rated value (3) Temperature Characteristics Specifications and Test (4) (6) (Public STD Code):X5R(EIA) (5) Nominal Methods Rated Capacitance Temp. coeff Temp. Range Capacitance (Operating Voltage Tolerance Temp. Range) orCap. Change (Ref.Temp.) -55 to 85 C -15 to 15 % DC 25 V 330 pF 10 % -55 to 85 C (25 C) 5.Package mark (8) Packaging Packaging Unit f180mm Reel D 15000 pcs./Reel PAPER W8P2 f180mm Reel W 30000 pcs./Reel PAPER W8P1 f330mm Reel J 50000 pcs./Reel PAPER W8P2 Product specifications in this catalog are as of Apr.5,2018,and are subject to change or obsolescence without notice. Please consult the approval sheet before ordering. Please read rating and Cautions first. GRT033R61E331KE01-01 1AEC-Q200 Murata Standard Specification and Test Methods No AEC-Q200 Test Item Specifications. AEC-Q200 Test Method 1 Pre-and Post-Stress - Electrical Test 2 High Temperature The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). Exposure (Storage) specifications in the following table. Set the capacitor for 1000+/-12 hours at maximum operating Appearance No marking defects temperature +/-3. Set for 24+/-2 hours at room temperature, then measure. Capacitance Within +/-12.5% Change Initial measurement Perform a heat treatment at 150+0/-10 for 1hour and then sit 0.2 max. D.F. for 24+/-2 hours at room temperature. Perform the initial measurement. Insulation More than 500M or 25 F (Whichever is smaller) Resistance 25 3 Temperature Cycling The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Perform the 1000 cycles test according to the four heat treatments Appearance No marking defects in the following table. Set for 24+/-2 hours at room temperature, then measure. Capacitance Within +/-7.5% Step 1 2 3 4 Change Temp. Room Room Min.Operating Temp.+0/-3 Max.Operating Temp. +3/-0 ( C) Temp. Temp. 0.2 max. D.F. Time 15+/-3 1 15+/-3 1 (min) Initial measurement Insulation Within the specified initial value. Perform a heat treatment at 150+0/-10 for 1hour and then sit Resistance for 24+/-2 hours at room temperature. Perform the initial measurement. 25 4 Destructive No defects or abnormalities Per EIA-469 Physical Analysis 5 Biased Humidity The measured and observed characteristics should satisfy the Solder the capacitor on the test substrate(glass epoxy board). specifications in the following table. Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8k resister) Appearance No marking defects at 85+/-3 and 80%RH to 85%RH humidity for 1000+/-12 hours. The charge/discharge current is less than 50mA. Capacitance Within +/-12.5% Change Initial measurement Perform a heat treatment at 150+0/-10 for 1hour and then sit 0.2 max. D.F. for 24+/-2 hours at room temperature. Perform the initial measurement. Measurement after test Insulation More than 100M or 5 F (Whichever is smaller) Perform a heat treatment at 150+0/-10 for 1hour and then sit Resistance for 24+/-2 hours at room temperature. Perform the initial measurement. 25 JEMCGS-05924 2

Tariff Desc

8532.24.00 43 no --Ceramic dielectric, multilayer Free

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