Product Information

NCV1124DG

NCV1124DG electronic component of ON Semiconductor

Datasheet
Interface - Specialized Dual Variable

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1: USD 1.3575 ea
Line Total: USD 1.36

0 - Global Stock
MOQ: 1  Multiples: 1
Pack Size: 1
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0 - WHS 1


Ships to you between Fri. 10 May to Thu. 16 May

MOQ : 1
Multiples : 1

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NCV1124DG
ON Semiconductor

1 : USD 1.3575
10 : USD 1.3452
50 : USD 1.3082
250 : USD 1.2279
500 : USD 1.1971
1000 : USD 1.1909

     
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NCV1124 Dual VariableReluctance Sensor Interface IC The NCV1124 is a monolithic integrated circuit designed primarily to condition signals from sensors used to monitor rotating parts. The NCV1124 is a dual channel device. Each of the two identical channels interfaces with a variablereluctance sensor, and NCV1124 MAXIMUM RATINGS Rating Value Unit Storage Temperature Range 65 to 150 C Ambient Operating Temperature 40 to 125 C Supply Voltage Range (continuous) 0.3 to 7.0 V Input Voltage Range (at any input, R1 = R2 = 22 k) 250 to 250 V Maximum Junction Temperature 150 C ESD Susceptibility (Human Body Model) 2.0 kV Lead Temperature Soldering: Reflow: (SMD styles only) (Note 1) 240 peak C Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. 60 second maximum above 183C. ELECTRICAL CHARACTERISTICS (4.5 V < V < 5.5 V, 40C < T < 125C, V = 0 unless otherwise specified.) CC A DIAG Characteristic Test Conditions Min Typ Max Unit V SUPPLY CC Operating Current Supply V = 5.0 V 5.0 mA CC Sensor Inputs Input Threshold Positive V = Low 135 160 185 mV DIAG V = High 135 160 185 mV DIAG Input Threshold Negative V = Low 185 160 135 mV DIAG V = High 135 160 185 mV DIAG Input Bias Current (INP1, INP2) V = 0.336 V 16 11 6.0 A IN Input Bias Current (DIAG) V = 0 V 1.0 A DIAG Input Bias Current Factor (K ) V = 0.336 V, V = Low 100 %INP I IN DIAG (IN = INP K ) V = 0.336 V, V = High 152 155 157 %INP Adj I IN DIAG Bias Current Matching INP1 or INP2 to IN , V = 0.336 V 1.0 0 1.0 A Adj IN Input Clamp Negative I = 50 A 0.5 0.25 0 V IN I = 12 mA 0.5 0.30 0 V IN Input Clamp Positive I = +12 mA 5.0 7.0 9.8 V IN Output Low Voltage I = 1.6 mA 0.2 0.4 V OUT Output High Voltage I = 1.6 mA V 0.5 V 0.2 V OUT CC CC Mode Change Time Delay 0 20 s Input to Output Delay I = 1.0 mA 1.0 20 s OUT Output Rise Time C = 30 pF 0.5 2.0 s LOAD Output Fall Time C = 30 pF 0.05 2.0 s LOAD OpenSensor Positive Threshold V = High, R = 40 k. Note 2 29.4 54 86.9 k DIAG IN(Adj) Logic Inputs DIAG Input Low Threshold 0.2 V V CC DIAG Input High Threshold 0.7 V V CC DIAG Input Resistance V = 0.3 V , V = 5.0 V 8.0 22 70 k IN CC CC V = V , V = 5.0 V 8.0 22 70 k IN CC CC 2. This parameter is guaranteed by design, but not parametrically tested in production.

Tariff Desc

8542.39.23 No ..Linear/analogue and peripheral integrated circuits, timers, voltage regulators, A/D and D/A converters, telecommunication and modem integrated circuits, other than board level products Free

Electronic integrated circuits- Processors and controllers, whether or not combined with memories, converters, logic circuits, amplifiers, clock and timing circuits, or other circuits
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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