TLP2630 TOSHIBA Photocoupler IRED & Photo IC TLP2630 Digital Logic Isolation TeleCommunication Analog Data Equipment Control Unit: mm Microprocessor System Interface The TOSHIBA TLP2630 dual photocoupler consists of a pair of infrared emitting diode and integrated high gain, high speed photodetector. The output of the detector circuit is an open collector, Schottky clamped transistor. This unit is 8 lead DIP. Input current threshold: I = 5 mA (max) F Switching speed: 10MBd Guaranteed performance over temperature: 0 to 70C Isolation voltage: 2500 V (min) rms UL-recognized: UL 1577, File No.E67349 cUL-recognized: CSA Component Acceptance Service No.5A File No.E67349 TOSHIBA 1110C4S Weight: 0.54 g (typ.) Truth Table Pin Configuration (top view) (positive logic) 1: Anode 1 V 1 CC 8 2: Cathode 1 Input Output 3: Cathode 2 2 7 H L 4: Anode 2 5: GND L H 3 6 6: V (output 2) O2 GND 7: V (output 1) 4 5 O1 8: V CC Schematic I I F1 CC 8 1 V + CC I O1 7 V F1 V O1 2 - I I F2 O2 6 4 V + O2 V F2 3 - 5 GND Note: A 0.1F bypass capacitor must connected between pins 8 and 5 (see Note 1). Start of commercial production 1986-03 2019 1 2019-06-17 Toshiba Electronic Devices & Storage Corporation TLP2630 Absolute Maximum Ratings (no derating required up to 70C) Characteristic Symbol Rating Unit Forward current(each channel) I 20 mA F Pulse forward current (each channel)* I 30 mA FP Reverse voltage(each channel) V 5 V R Input power dissipation(each channel) P 25 mW D Input power dissipation derating (Ta 70C) PD/C -0.45 mW/C (each channel) Output current(each channel) I 16 mA O Output voltage(each channel) V 0.5 to 7 V O Supply voltage (1 minute maximum) V 7 V CC Output power dissipation(each channel) P 40 mW O Output power dissipation derating (Ta 70C) PO/C -0.75 mW/C (each channel) Operating temperature range T 55 to 125 C stg Storage temperature range T 40 to 85 C opr Lead soldering temperature (10 s) (Note 1) T 260 C sol Isolation voltage (AC, 60 s, R.H. 60 %, Note 3) BV 2500 Vrms S Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). * t 1 ms duration. Recommended Operating Conditions Characteristic Symbol Min Typ. Max Unit Input current, low level, each channel I 0 250 A FL Input current, high level, each channel I 6.3* 20 mA FH Supply voltage** V 4.5 5 5.5 V CC Fan out(TTL load, each channel) N 8 Operating temperature T 0 70 C opr Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guideline respectively. In developing designs using this product, please confirm specified characteristics shown in this document. * 6.3 mA is a guard banded value which allows for at least 20 % CTR degradation. Initial input current threshold value is 5 mA or less. **This item denotes operating ranges, not meaning of recommended operating conditions. 2019 2 2019-06-17 Toshiba Electronic Devices & Storage Corporation Detector LED