2N6052 Preferred Device Darlington Complementary Silicon Power Transistors This package is designed for generalpurpose amplifier and low frequency switching applications. Features 2N6052 ELECTRICAL CHARACTERISTICS (T = 25 C unless otherwise noted) (Note 2) C Characteristic Symbol Min Max Unit OFF CHARACTERISTICS CollectorEmitter Sustaining Voltage (Note 3) (I = 100 mAdc, I = 0) V 100 Vdc C B CEO(sus) Collector Cutoff Current (V = 50 Vdc, I = 0) I 1.0 mAdc CE B CEO Collector Cutoff Current I mAdc CEX (V = Rated V , V = 1.5 Vdc) CE CEO BE(off) 0.5 (V = Rated V , V = 1.5 Vdc, T = 150 C) CE CEO BE(off) C 5.0 Emitter Cutoff Current (V = 5.0 Vdc, I = 0) I 2.0 mAdc BE C EBO ON CHARACTERISTICS (Note 3) DC Current Gain h FE (I = 6.0 Adc, V = 3.0 Vdc) C CE 750 18,000 (I = 12 Adc, V = 3.0 Vdc) C CE 100 CollectorEmitter Saturation Voltage V Vdc CE(sat) (I = 6.0 Adc, I = 24 mAdc) C B 2.0 (I = 12 Adc, I = 120 mAdc) C B 3.0 BaseEmitter Saturation Voltage (I = 12 Adc, I = 120 mAdc) V 4.0 Vdc C B BE(sat) BaseEmitter On Voltage (I = 6.0 Adc, V = 3.0 Vdc) V 2.8 Vdc C CE BE(on) DYNAMIC CHARACTERISTICS Magnitude of Common Emitter SmallSignal Short Circuit Forward h 4.0 MHz fe Current Transfer Ratio (I = 5.0 Adc, V = 3.0 Vdc, f = 1.0 MHz) C CE Output Capacitance (V = 10 Vdc, I = 0, f = 0.1 MHz) C 500 pF CB E ob SmallSignal Current Gain (I = 5.0 Adc, V = 3.0 Vdc, f = 1.0 kHz) h 300 C CE fe 2. Indicates JEDEC Registered Data. 3. Pulse test: Pulse Width = 300 s, Duty Cycle = 2.0%. V 10 CC R & R VARIED TO OBTAIN DESIRED CURRENT LEVELS B C - 30 V 2N6052 D MUST BE FAST RECOVERY TYPE, eg: 1 5.0 2N6059 1N5825 USED ABOVE I 100 mA B R C SCOPE t MSD6100 USED BELOW I 100 mA s B TUT 2.0 V 2 R B t approx f + 8.0 V 1.0 D 1 5.0 k 51 50 0 t r 0.5 V 1 + 4.0 V approx V = 30 V CC t V = 0 - 8.0 V d BE(off) 25 s for t and t , D is disconnected I /I = 250 d r 1 C B 0.2 and V = 0 2 I = I B1 B2 t , t 10 ns r f T = 25C J DUTY CYCLE = 1.0% 0.1 0.2 0.5 1.0 3.0 5.0 10 20 For NPN test circuit reverse diode and voltage polarities. I , COLLECTOR CURRENT (AMP) C Figure 2. Switching Times Test Circuit Figure 3. Switching Times