Product Information

CAT24C01YI-G

CAT24C01YI-G electronic component of ON Semiconductor

Datasheet
EEPROM Serial-I2C 1K-bit 128 x 8 1.8V/2.5V/3.3V/5V 8-Pin TSSOP

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

3206: USD 0.1312 ea
Line Total: USD 420.63

0 - Global Stock
MOQ: 3206  Multiples: 3206
Pack Size: 3206
Availability Price Quantity
0 - WHS 1


Ships to you between Tue. 21 May to Mon. 27 May

MOQ : 1
Multiples : 1

Stock Image

CAT24C01YI-G
ON Semiconductor

1 : USD 0.2894
25 : USD 0.176
100 : USD 0.132
500 : USD 0.1063
1000 : USD 0.1014
2500 : USD 0.0978
5000 : USD 0.0917

0 - WHS 2


Ships to you between Tue. 21 May to Mon. 27 May

MOQ : 3206
Multiples : 3206

Stock Image

CAT24C01YI-G
ON Semiconductor

3206 : USD 0.1312

0 - WHS 3


Ships to you between Tue. 21 May to Mon. 27 May

MOQ : 95
Multiples : 1

Stock Image

CAT24C01YI-G
ON Semiconductor

95 : USD 0.1828
100 : USD 0.132
500 : USD 0.1063
1000 : USD 0.1014

     
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RoHS - XON
Icon ROHS
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Supply Voltage - Min
Supply Voltage - Max
Minimum Operating Temperature
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Maximum Clock Frequency
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CAT24C01, CAT24C02, CAT24C04, CAT24C08, CAT24C16 1-Kb, 2-Kb, 4-Kb, 8-Kb and 2 16-Kb I C CMOS Serial CAT24C01, CAT24C02, CAT24C04, CAT24C08, CAT24C16 V CC Table 1. PIN FUNCTION Pin Name Function A0, A1, A2 Device Address Input SCL SDA Serial Data Input/Output SCL Serial Clock Input A , A , A CAT24Cxx SDA 2 1 0 WP Write Protect Input WP V Power Supply CC V Ground SS NC No Connect V SS The exposed pad for the TDFN/UDFN packages can be left floating or connected to Ground. Figure 1. Functional Symbol Table 2. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Storage Temperature 65 to +150 C Voltage on any pin with respect to Ground (Note 1) 0.5 to +6.5 V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. During input transitions, voltage undershoot on any pin should not exceed 1 V for more than 20 ns. Voltage overshoot on pins A , A , A 0 1 2 2 and WP should not exceed V + 1 V for more than 20 ns, while voltage on the I C bus pins, SCL and SDA, should not exceed the absolute CC maximum ratings, irrespective of V . CC Table 3. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units N (Note 3) Endurance 1,000,000 Program / Erase Cycles END T Data Retention 100 Years DR 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. 3. Page Mode, V = 5 V, 25C. CC Table 4. D.C. OPERATING CHARACTERISTICS (V = 1.8 V to 5.5 V, T = 40C to +125C and V = 1.7 V to 5.5 V, T = 40C to +85C, unless otherwise specified.) CC A CC A Symbol Parameter Test Conditions Min Max Units I Read Current Read, f = 400 kHz 1 mA CCR SCL I Write Current Write, f = 400 kHz 2 mA CCW SCL I Standby Current All I/O Pins at GND or V T = 40C to +85C 1 A SB CC A V 3.3 V CC T = 40C to +85C 3 A V > 3.3 V CC T = 40C to +125C 5 A I I/O Pin Leakage Pin at GND or V 2 A L CC V Input Low Voltage 0.5 0.3 x V V IL CC V Input High Voltage A , A , A and WP 0.7 x V V + 0.5 V IH 0 1 2 CC CC SCL and SDA 0.7 x V 5.5 CC V Output Low V > 2.5 V, I = 3 mA 0.4 OL CC OL Voltage V < 2.5 V, I = 1 mA 0.2 CC OL

Tariff Desc

8542.32.00 32 No ..CMOS and MOS Read Only Memory and Programmable Read Only Memory whether erasable or non-erasable (for example, flash memory, EPROM, E2PROM, EAPROM, NOVRAM, ROM and PROM)
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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