Product Information

CAT24AA08WI-GT3

CAT24AA08WI-GT3 electronic component of ON Semiconductor

Datasheet
EEPROM 8K-Bit I2C Serial EEPROM

Manufacturer: ON Semiconductor
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1759: USD 0.1604 ea
Line Total: USD 282.14

0 - Global Stock
MOQ: 1759  Multiples: 1759
Pack Size: 1759
Availability Price Quantity
0 - WHS 1


Ships to you between Wed. 22 May to Tue. 28 May

MOQ : 3000
Multiples : 1

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CAT24AA08WI-GT3
ON Semiconductor

3000 : USD 0.2983
3000 : USD 0.2866
3000 : USD 0.2808
3000 : USD 0.2691
12000 : USD 0.2691
21000 : USD 0.2691

0 - WHS 2


Ships to you between Wed. 22 May to Tue. 28 May

MOQ : 1759
Multiples : 1759

Stock Image

CAT24AA08WI-GT3
ON Semiconductor

1759 : USD 0.1604

     
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CAT24AA04, CAT24AA08 2 4-Kb and 8-Kb I C CMOS Serial EEPROM Description The CAT24AA04/24AA08 are 4 Kb and 8Kb CMOS Serial EEPROM devices internally organized as 512x8/1024x8 bits. CAT24AA04, CAT24AA08 Table 1. ABSOLUTE MAXIMUM RATINGS Parameters Ratings Units Storage Temperature 65 to +150 C Voltage on any Pin with Respect to Ground (Note 1) 0.5 to +6.5 V Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. The DC input voltage on any pin should not be lower than 0.5 V or higher than V + 0.5 V. During transitions, the voltage on any pin may CC undershoot to no less than 1.5 V or overshoot to no more than V + 1.5 V, for periods of less than 20 ns. CC Table 2. RELIABILITY CHARACTERISTICS (Note 2) Symbol Parameter Min Units N (Note 3) Endurance 1,000,000 Program/Erase Cycles END T Data Retention 100 Years DR 2. These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AECQ100 and JEDEC test methods. 3. Page Mode 25C Table 3. D.C. OPERATING CHARACTERISTICS (V = 1.7 V to 5.5 V, T = 40C to 85C, unless otherwise specied.) CC A Symbol Parameter Test Conditions Min Max Units I Read Current Read, f = 400 kHz 0.5 mA CCR SCL I Write Current Write, f = 400 kHz 1 mA CCW SCL I Standby Current All I/O Pins at GND or V 1 A SB CC I I/O Pin Leakage Pin at GND or V 1 A L CC V Input Low Voltage 0.5 V x 0.3 V IL CC V Input High Voltage V x 0.7 V + 0.5 V IH CC CC V Output Low Voltage V 2.5 V, I = 3.0 mA 0.4 V OL1 CC OL V Output Low Voltage V < 2.5 V, I = 1.0 mA 0.2 V OL2 CC OL Table 4. PIN IMPEDANCE CHARACTERISTICS (V = 1.7 V to 5.5 V, T = 40C to 85C, unless otherwise specied.) CC A Symbol Parameter Conditions Max Units C (Note 2) SDA I/O Pin Capacitance V = 0 V 8 pF IN IN C (Note 2) Input Capacitance (other pins) V = 0 V 6 pF IN IN I (Note 4) WP Input Current V < 0.5xV , V = 5.5 V 200 A WP IN CC CC V < 0.5xV , V = 3.3 V 150 IN CC CC V < 0.5xV , V = 1.8 V 100 IN CC CC V > 0.5xV 1 IN CC 4. When not driven, the WP pin is pulled down to GND internally. For improved noise immunity, the internal pull down is relatively strong therefore the external driver must be able to supply the pulldown current when attempting to drive the input HIGH. To conserve power, as the input level exceeds the trip point of the CMOS input buffer (~ 0.5 x V ), the strong pulldown reverts to a weak current source. CC

Tariff Desc

8542.32.00 32 No ..CMOS and MOS Read Only Memory and Programmable Read Only Memory whether erasable or non-erasable (for example, flash memory, EPROM, E2PROM, EAPROM, NOVRAM, ROM and PROM)
Aptina / ON Semiconductor
FAIRCHILD
FAIRCHILD (ON SEMICONDUCTOR)
Fairchild Semiconductor
FS8
FSC
ON
ON SEMI
ON Semicon
ON SEMICONDUCTOR
ON SEMICONDUCTOR (FAIRCHILD)
ON Semiconductor / Fairchild
ON4
ON5
onsemi
ON-SEMI
onsemi / Fairchild
OOF
Xsens / Fairchild

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