Product Information

DF5A6.2JE,LM

DF5A6.2JE,LM electronic component of Toshiba

Datasheet
ESD Suppressors / TVS Diodes X34 ESD Protection Diode ESV package

Manufacturer: Toshiba
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

1: USD 0.44 ea
Line Total: USD 0.44

8755 - Global Stock
Ships to you between
Thu. 16 May to Mon. 20 May
MOQ: 1  Multiples: 1
Pack Size: 1
Availability Price Quantity
8735 - WHS 1


Ships to you between Thu. 16 May to Mon. 20 May

MOQ : 1
Multiples : 1

Stock Image

DF5A6.2JE,LM
Toshiba

1 : USD 0.3164
10 : USD 0.2138
100 : USD 0.0882
1000 : USD 0.0543
4000 : USD 0.0543
8000 : USD 0.0423
24000 : USD 0.0411
48000 : USD 0.0386
100000 : USD 0.0362

     
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Product Category
RoHS - XON
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Cnhts
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Mxhts
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DF5A6.2JE TOSHIBA Diodes for Protecting against ESD DF5A6.2JE Product for Use Only as Protection against Electrostatic Unit: mm Discharge (ESD) * This product is for protection against electrostatic discharge (ESD) only and is not intended for any other usage, including without limitation, the constant voltage diode application. z The mounting of four devices on an ultra-compact package allows the number of parts and the mounting cost to be reduced. Absolute Maximum Ratings (Ta = 25C) Characteristic Symbol Rating Unit 1.CATHODE1 Power dissipation P 100 mW 2.ANODE 3.CATHODE2 Junction temperature T 150 C j 4.CATHODE3 5.CATHODE4 Storage temperature range T 55 to 150 C stg Note: Using continuously under heavy loads (e.g. the application of high JEDEC temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the JEITA reliability significantly even if the operating conditions (i.e. TOSHIBA 1-2W1A operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Weight: 0.003 g (typ.) Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Electrical Characteristics (Ta = 25C) Characteristic Symbol Test Condition Min Typ. Max Unit Zener voltage V I = 5 mA 5.8 6.2 6.6 V Z Z Dynamic impedance Z I = 5 mA 30 Z Z Reverse current I V =3 V 1.0 A R R Terminal capacitance C V = 0, f = 1 MHz 55 pF T R (between Cathode and Anode) Guaranteed Level of ESD Immunity Test Condition ESD Immunity Level IEC61000-4-2 30 kV (Contact discharge) Criterion: No damage to device elements Start of commercial production 2002-03 1 2014-03-01 DF5A6.2JE Marking Equivalent Circuit (Top View) 6.2 IZ - VZ CT - VR 100 100 Ta=25C Ta=25C f=1MHz 10 1 0 0.1 0.001 10 0.0001 02 46 8 0 12 345 67 89 10 REVERSE VOLTAGE VR (V) ZENER VOLTAGE VZ (V) 2 2014-03-01 ZENER CURRENT IZ (mA) TOTAL CAPACITANCE CT (pF)

Tariff Desc

8541.10.00 15 No - Diodes, other than photosensitive or light emitting diodes Free

DIODES, TRANSISTORS AND SIMILAR SEMICONDUCTOR DEVICES; PHOTOSENSITIVE SEMICONDUCTOR DEVICES, INCLUDING PHOTOVOLTAIC CELLS WHETHER OR NOT ASSEMBLED IN MODULES OR MADE UP INTO PANELS
Toshiba Memory
Toshiba Memory Corporation
Toshiba Semiconductor and Storage
TOSHIBA SEMICONDUCTORS
TS4

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