Product Information

DF3A6.8FV(TPL3,Z)

DF3A6.8FV(TPL3,Z) electronic component of Toshiba

Datasheet
Diode Zener Dual Common Anode 6.8V 6% 150mW 3-Pin VESM T/R

Manufacturer: Toshiba
This product is classified as Large/Heavy, additional shipping charges may apply. A customer service representative may contact you after ordering to confirm exact shipping charges



Price (USD)

503: USD 0.0744 ea
Line Total: USD 37.42

0 - Global Stock
MOQ: 503  Multiples: 1
Pack Size: 1
Availability Price Quantity
0 - WHS 1


Ships to you between Fri. 17 May to Thu. 23 May

MOQ : 503
Multiples : 1
503 : USD 0.0744

     
Manufacturer
Product Category
RoHS - XON
Icon ROHS
Packaging
Brand
Vz - Zener Voltage
Voltage Tolerance
Configuration
Mounting Style
Pin Count
Rev Curr
Operating Temperature Classification
Operating Temp Range
Rad Hardened
Knee Impedance
Package Type
LoadingGif

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DF3A6.8FV TOSHIBA Diodes for Protecting against ESD Epitaxial Planar Type DF3A6.8FV Product for Use Only as Protection against Electrostatic Unit: mm Discharge (ESD). 1.20.05 0.80.05 * This product is for protection against electrostatic discharge (ESD) only and is not intended for any other usage, including without limitation, the constant voltage diode application. 1 2 3 Because two devices are mounted on an ultra compact package, it is possible to allow reducing the number of the parts and the mounting cost. Absolute Maximum Ratings (Ta = 25C) Characteristics Symbol Rating Unit Power dissipation P* 150 mW 1.CATHODE1 Junction temperature T 150 C j 2.CATHODE2 VESM Storage temperature range T 55~150 C stg 3.ANODE JEDEC Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in JEITA temperature, etc.) may cause this product to decrease in the TOSHIBA 1-1Q1B reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the Weight: 0.0015 g (typ.) absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (Handling Precautions/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). *: Mounted on FR4 board (25.4 mm 25.4 mm 1.6 mmt) 0.5mm 0.45mm 0.45mm 0.4mm Electrical Characteristics (Ta = 25C) Characteristics Symbol Test Condition Min Typ. MaxUnit Zener voltage V I = 5 mA 6.4 6.8 7.2 V Z Z Dynamic impedance Z I = 5 mA 25 Z Z Reverse current I V = 5 V 0.5 A R R Terminal capacitance C V = 0, f = 1MHz 45 pF T R (between Cathode and Anode) 1 2007-11-01 1.20.05 0.80.05 0.50.05 0.4 0.4 0.220.05 0.130.05 0.320.05 DF3A6.8FV Guaranteed Level of ESD Immunity Test Condition ESD Immunity Level IEC61000-4-2 30kV (Contact discharge) Criterion: No damage to device elements Marking Equivalent Circuit (top view) 6.8 CT - VR 100 Ta=25C f=1MHz 10 02 468 REVERSE VOLTAGE VR (V) 2 2007-11-01 TOTAL CAPACITANCE CT (pF)

Tariff Desc

8541.10.00 15 No - Diodes, other than photosensitive or light emitting diodes Free

DIODES, TRANSISTORS AND SIMILAR SEMICONDUCTOR DEVICES; PHOTOSENSITIVE SEMICONDUCTOR DEVICES, INCLUDING PHOTOVOLTAIC CELLS WHETHER OR NOT ASSEMBLED IN MODULES OR MADE UP INTO PANELS
Toshiba Memory
Toshiba Memory Corporation
Toshiba Semiconductor and Storage
TOSHIBA SEMICONDUCTORS
TS4

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