PD - 94816
IRF4905PbF
HEXFET Power MOSFET
 Advanced Process Technology
 Ultra Low On-Resistance
D
 Dynamic dv/dt Rating
V = -55V
DSS
 175C Operating Temperature
 Fast Switching
R = 0.02
DS(on)
G
 P-Channel
 Fully Avalanche Rated
I = -74A
D
 Lead-Free S
Description
Fifth Generation HEXFETs from International Rectifier
utilize advanced processing techniques to achieve
extremely low  on-resistance per silicon area.  This
benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power
MOSFETs are well known for, provides the designer
with an extremely efficient and reliable device for use
in a wide variety of applications.
The TO-220 package is universally preferred for all
commercial-industrial applications at power
TO-220AB
dissipation levels to approximately 50 watts.  The low
thermal resistance and low package cost of the TO-
220 contribute to its wide acceptance throughout the
industry.
Absolute Maximum Ratings
Parameter Max. Units
I @ T = 25C Continuous Drain Current, V @ -10V -74
D C GS
I @ T = 100C Continuous Drain Current, V @ -10V -52 A
D C GS
I Pulsed Drain Current  -260
DM
P @T = 25C Power Dissipation 200 W
D C
Linear Derating Factor 1.3 W/C
V Gate-to-Source Voltage  20 V
GS
E Single Pulse Avalanche Energy 930 mJ
AS
I Avalanche Current -38 A
AR
E Repetitive Avalanche Energy 20 mJ
AR
dv/dt Peak Diode Recovery dv/dt  -5.0 V/ns
T Operating Junction and -55  to + 175
J
T Storage Temperature Range
C
STG
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
Mounting torque, 6-32 or M3 screw 10 lbfin (1.1Nm)
Thermal Resistance
Parameter Typ. Max. Units
R Junction-to-Case  0.75
JC
R Case-to-Sink, Flat, Greased Surface 0.50  C/W
CS
R Junction-to-Ambient  62
JA
11/6/03IRF4905PbF
Electrical Characteristics @ T = 25C (unless otherwise specified)
J
Parameter Min. Typ. Max. Units        Conditions
V Drain-to-Source Breakdown Voltage -55   V V = 0V, I = -250A
(BR)DSS GS D
V /T Breakdown Voltage Temp. Coefficient  -0.05  V/C Reference to 25C, I = -1mA
(BR)DSS J D
R Static Drain-to-Source On-Resistance   0.02  V = -10V, I = -38A 
DS(on) GS D
V Gate Threshold Voltage -2.0  -4.0 V V = V , I = -250A
GS(th) DS GS D
g Forward Transconductance 21   S V = -25V, I = -38A
fs DS D
  -25 V = -55V, V = 0V
DS GS
I Drain-to-Source Leakage Current
A
DSS
  -250 V = -44V, V = 0V, T = 150C
DS GS J
Gate-to-Source Forward Leakage   100 V = 20V
GS
I nA
GSS
Gate-to-Source Reverse Leakage   -100 V = -20V
GS
Q Total Gate Charge   180 I = -38A
g D
Q Gate-to-Source Charge   32 nC V = -44V
gs DS
Q Gate-to-Drain Mille) Charge   86 V = -10V, See Fig. 6 and 13 
gd GS
t Turn-On Delay Time  18  V = -28V
d(on) DD
t Rise Time  99  I = -38A
r D
ns
t Turn-Off Delay Time  61  R = 2.5
d(off) G
t Fall Time  96  R = 0.72, See Fig. 10 
f D
D
Between lead,
L Internal Drain Inductance  4.5 
D
6mm (0.25in.)
nH
G
from package
L Internal Source Inductance  7.5 
S
and center of die contact
S
C Input Capacitance  3400  V = 0V
iss GS
C Output Capacitance  1400  pF V = -25V
oss DS
C Reverse Transfer Capacitance  640   = 1.0MHz, See Fig. 5
rss
Source-Drain Ratings and Characteristics
 Parameter Min. Typ. Max. Units       Conditions
D
I Continuous Source Current MOSFET symbol
S
-74
 
(Body Diode) showing  the
A
G
I Pulsed Source Current integral reverse
SM
  -260
(Body Diode)  p-n junction diode.
S
V Diode Forward Voltage   -1.6 V T = 25C, I = -38A, V = 0V 
SD J S GS
t Reverse Recovery Time  89 130 ns T = 25C, I = -38A
rr J F
Q Reverse Recovery Charge  230 350 nC di/dt = -100A/s
rr 
t Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by L +L )
on S D
Notes:
 Repetitive rating;  pulse width limited by
 I  -38A, di/dt  -270A/s, V  V ,
SD DD (BR)DSS
     max. junction temperature. ( See fig. 11 )
     T  175C
J 
  Starting T = 25C, L = 1.3mH  Pulse width  300s; duty cycle  2%.
J 
     R = 25, I = -38A. (See Figure 12)
G AS